Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system (2007)
Source: Physica Status Solidi A - Application and Materials Science. Unidade: IF
Assunto: SUPERFÍCIE FÍSICA
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FREITAS, Raul de Oliveira et al. Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system. Physica Status Solidi A - Application and Materials Science, v. 204, n. 8, p. 2548-2454, 2007Tradução . . Disponível em: https://doi.org/10.1002/pssa.200675673. Acesso em: 04 maio 2024.APA
Freitas, R. de O., Lamas, T. E., Quivy, A. A., & Morelhão, S. L. (2007). Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system. Physica Status Solidi A - Application and Materials Science, 204( 8), 2548-2454. doi:10.1002/pssa.200675673NLM
Freitas R de O, Lamas TE, Quivy AA, Morelhão SL. Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system [Internet]. Physica Status Solidi A - Application and Materials Science. 2007 ; 204( 8): 2548-2454.[citado 2024 maio 04 ] Available from: https://doi.org/10.1002/pssa.200675673Vancouver
Freitas R de O, Lamas TE, Quivy AA, Morelhão SL. Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system [Internet]. Physica Status Solidi A - Application and Materials Science. 2007 ; 204( 8): 2548-2454.[citado 2024 maio 04 ] Available from: https://doi.org/10.1002/pssa.200675673
